Product Summary
The SCANSTA111MT is an Enhanced SCAN bridge. It extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment.
Parametrics
SCANSTA111MT absolute maximum ratings: (1)Supply Voltage (VCC): -0.3V to +4.0V; (2)DC Input Diode Current (IIK) VI = -0.5V: -20 mA; (3)DC Input Voltage (VI): -0.5V to +3.9V; (4)DC Output Diode Current (IOK) VO = -0.5V: -20 mA; (5)DC Output Voltage (VO): -0.3V to +3.9V; (6)DC Output Source/Sink Current (IO): ±50 mA; (7)DC VCC or Ground Current: ±50 mA per Output Pin; (8)DC Latchup Source or Sink Current: ±300 mA; (9)Junction Temperature (Plastic): +150℃; (10)Storage Temperature: -65℃ to +150℃.
Features
SCANSTA111MT features: (1)True IEEE 1149.1 hierarchical and multidrop addressable capability; (2)The 7 slot inputs support up to 121 unique addresses, an Interrogation Address, Broadcast Address, and 4 Multi-cast Group Addresses (address 000000 is reserved); (3)3 IEEE 1149.1-compatible configurable local scan ports; (4)Mode Register0 allows local TAPs to be bypassed, selected for insertion into the scan chain individually, or serially in groups of two or three.
Diagrams
Image | Part No | Mfg | Description | Pricing (USD) |
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SCANSTA111MT |
National Semiconductor (TI) |
Interface - Specialized |
Data Sheet |
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SCANSTA111MT/NOPB |
National Semiconductor (TI) |
Interface - Specialized |
Data Sheet |
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SCANSTA111MTX/NOPB |
National Semiconductor (TI) |
Interface - Specialized |
Data Sheet |
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SCANSTA111MTX |
National Semiconductor (TI) |
Interface - Specialized |
Data Sheet |
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